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Functions | |
| IFX_EXTERN void | IfxMtu_clearSram (IfxMtu_MbistSel mbistSel) |
| Function to Clear the MBIST SRAM (Synchronous mode). Note: The function clears & sets safety endinit bit while running the test to prevent watchdog TO and automatically restores the endinit state (same state at the time of entering the function) at the end. More... | |
| IFX_EXTERN void | IfxMtu_clearSramContinue (IfxMtu_MbistSel mbistSel) |
| This Function should be called after MBIST Clear SRAM operation is completed. Note: The function should be called with safety endinit bit cleared. More... | |
| IFX_EXTERN void | IfxMtu_clearSramStart (IfxMtu_MbistSel mbistSel) |
| This Function triggers the Clear the MBIST SRAM operation (Asynchronous operation). It doesn't wait till the end of operation. The application has to poll the Mbist status (IfxMtu_isMbistDone()) in a task and once the operation is done, the IfxMtu_clearSramContinue() function should be called to complete the operation. If Synchronous usage is need, use IfxMtu_clearSram() function. Note: The function should be called with safety endinit bit cleared. More... | |
| IFX_EXTERN boolean | IfxMtu_isMbistDone (IfxMtu_MbistSel mbistSel) |
| This Function returns the status of MBIST clear Sram operation. Caution: It is recommended not to call this function continously in a loop. Use IfxMtu_ClearSram() function for Synchronous polling mode. More... | |
| IFX_EXTERN void | IfxMtu_readSramAddress (IfxMtu_MbistSel mbistSel, uint16 sramAddress) |
| IFX_EXTERN uint8 | IfxMtu_runCheckerBoardTest (IfxMtu_MbistSel mbistSel, uint8 rangeSel, uint8 rangeAddrUp, uint8 rangeAddrLow, uint16 *errorAddr, uint32 numberRedundancyLines) |
| Run CheckerBoard test. This test consists of writing the physical checkerboard pattern into the memory, then reading it back for verification Note: The function clears & sets safety endinit bit while running the test to prevent watchdog TO and automatically restores the endinit state (same state at the time of entering the function) at the end. More... | |
| IFX_EXTERN uint8 | IfxMtu_runMarchUTest (IfxMtu_MbistSel mbistSel, uint8 rangeSel, uint8 rangeAddrUp, uint8 rangeAddrLow, uint16 *errorAddr) |
| Run March U test. This test MARCHES 0 and 1 values through the memory array in an up and down direction. More precisely, 0 and 1 values are propagated through the memory in each direction; i.e. a single bit cell toggles into each direction with the neighboring cells having a given value and, in another run, the inverse given value. Note: The function clears & sets safety endinit bit while running the test to prevent watchdog TO and automatically restores the endinit state (same state at the time of entering the function) at the end. More... | |
| IFX_EXTERN uint8 | IfxMtu_runNonDestructiveInversionTest (IfxMtu_MbistSel mbistSel, uint8 rangeSel, uint8 rangeAddrUp, uint8 rangeAddrLow, uint16 *errorAddr) |
| This function runs the Non-Destructive Inversion test algorithm. Non-Destructive Inversion test can be considered as a simple linear test that is able to find all Stuck-At faults (the cell remains stuck at a value for any operation) without destroying any user data. The test accesses every Word in the address range defined by the RANGE register, four times. Test Steps: More... | |
| IFX_EXTERN void | IfxMtu_writeSramAddress (IfxMtu_MbistSel mbistSel, uint16 sramAddress) |
Detailed Description
Function Documentation
| IFX_EXTERN void IfxMtu_clearSram | ( | IfxMtu_MbistSel | mbistSel) |
Function to Clear the MBIST SRAM (Synchronous mode). Note: The function clears & sets safety endinit bit while running the test to prevent watchdog TO and automatically restores the endinit state (same state at the time of entering the function) at the end.
- Parameters
-
mbistSel Memory Selection
- Returns
- None
A coding example can be found in How to use the Mtu driver?
Definition at line 60 of file IfxMtu.c.
Referenced by IfxEray_Eray_initModule().
| IFX_EXTERN void IfxMtu_clearSramContinue | ( | IfxMtu_MbistSel | mbistSel) |
This Function should be called after MBIST Clear SRAM operation is completed. Note: The function should be called with safety endinit bit cleared.
- Parameters
-
mbistSel Memory Selection
- Returns
- None
A coding example can be found in How to use the Mtu driver?
Definition at line 103 of file IfxMtu.c.
Referenced by IfxMtu_clearSram().
| IFX_EXTERN void IfxMtu_clearSramStart | ( | IfxMtu_MbistSel | mbistSel) |
This Function triggers the Clear the MBIST SRAM operation (Asynchronous operation). It doesn't wait till the end of operation. The application has to poll the Mbist status (IfxMtu_isMbistDone()) in a task and once the operation is done, the IfxMtu_clearSramContinue() function should be called to complete the operation. If Synchronous usage is need, use IfxMtu_clearSram() function. Note: The function should be called with safety endinit bit cleared.
- Parameters
-
mbistSel Memory Selection
- Returns
- None
A coding example can be found in How to use the Mtu driver?
Definition at line 117 of file IfxMtu.c.
Referenced by IfxMtu_clearSram().
| IFX_EXTERN boolean IfxMtu_isMbistDone | ( | IfxMtu_MbistSel | mbistSel) |
This Function returns the status of MBIST clear Sram operation. Caution: It is recommended not to call this function continously in a loop. Use IfxMtu_ClearSram() function for Synchronous polling mode.
- Parameters
-
mbistSel Memory Selection
- Returns
- status of Mbist Clear Sram operation (TRUE - Operation completed, FALSE - Operation still in progress)
A coding example can be found in How to use the Mtu driver?
Definition at line 309 of file IfxMtu.c.
Referenced by IfxMtu_clearSram(), IfxMtu_readSramAddress(), IfxMtu_runCheckerBoardTest(), IfxMtu_runMarchUTest(), IfxMtu_runNonDestructiveInversionTest(), and IfxMtu_writeSramAddress().
| IFX_EXTERN void IfxMtu_readSramAddress | ( | IfxMtu_MbistSel | mbistSel, |
| uint16 | sramAddress | ||
| ) |
- Parameters
-
mbistSel Memory Selection sramAddress SRAM address which should be read
- Returns
- None
A coding example can be found in How to use the Mtu driver?
Definition at line 319 of file IfxMtu.c.
Referenced by IfxMtu_clearSramContinue().
| IFX_EXTERN uint8 IfxMtu_runCheckerBoardTest | ( | IfxMtu_MbistSel | mbistSel, |
| uint8 | rangeSel, | ||
| uint8 | rangeAddrUp, | ||
| uint8 | rangeAddrLow, | ||
| uint16 * | errorAddr, | ||
| uint32 | numberRedundancyLines | ||
| ) |
Run CheckerBoard test. This test consists of writing the physical checkerboard pattern into the memory, then reading it back for verification Note: The function clears & sets safety endinit bit while running the test to prevent watchdog TO and automatically restores the endinit state (same state at the time of entering the function) at the end.
- Parameters
-
mbistSel Memory Selection rangeSel enable/disable range Selection (0 - disable, 1- enable) rangeAddrUp when range mode is enabled, it specifies the upper logical block address limit in 64 word increments. rangeAddrLow when range mode is enabled, it specifies the lower logical block address limit. errorAddr If the test fails, it contains the error address (bit0 - bit12) and memory block index (Bit13 - Bit15)
- Returns
- Test Status (0-PASS, 1- FAIL)
| IFX_EXTERN uint8 IfxMtu_runMarchUTest | ( | IfxMtu_MbistSel | mbistSel, |
| uint8 | rangeSel, | ||
| uint8 | rangeAddrUp, | ||
| uint8 | rangeAddrLow, | ||
| uint16 * | errorAddr | ||
| ) |
Run March U test. This test MARCHES 0 and 1 values through the memory array in an up and down direction. More precisely, 0 and 1 values are propagated through the memory in each direction; i.e. a single bit cell toggles into each direction with the neighboring cells having a given value and, in another run, the inverse given value. Note: The function clears & sets safety endinit bit while running the test to prevent watchdog TO and automatically restores the endinit state (same state at the time of entering the function) at the end.
- Parameters
-
mbistSel Memory Selection rangeSel enable/disable range Selection (0 - disable, 1- enable) rangeAddrUp when range mode is enabled, it specifies the upper logical block address limit in 64 word increments. rangeAddrLow when range mode is enabled, it specifies the lower logical block address limit. errorAddr If the test fails, it contains the error address (bit0 - bit12) and memory block index (Bit13 - Bit15)
- Returns
- Test Status (0-PASS, 1- FAIL)
| IFX_EXTERN uint8 IfxMtu_runNonDestructiveInversionTest | ( | IfxMtu_MbistSel | mbistSel, |
| uint8 | rangeSel, | ||
| uint8 | rangeAddrUp, | ||
| uint8 | rangeAddrLow, | ||
| uint16 * | errorAddr | ||
| ) |
This function runs the Non-Destructive Inversion test algorithm. Non-Destructive Inversion test can be considered as a simple linear test that is able to find all Stuck-At faults (the cell remains stuck at a value for any operation) without destroying any user data. The test accesses every Word in the address range defined by the RANGE register, four times. Test Steps:
- Read data Word including check bits
- write back all bits inverted
- Read data Word including check bits
- Write back all bits inverted At the end of this procedure the user data remains unchanged and and every bit has been set to 0 and 1. Any single Stuck-At error will be visible as a correctable error. Note: The function clears & sets safety endinit bit while running the test to prevent watchdog TO and automatically restores the endinit state (same state at the time of entering the function) at the end.
- Parameters
-
mbistSel Memory Selection rangeSel enable/disable range Selection (0 - disable, 1- enable) rangeAddrUp when range mode is enabled, it specifies the upper logical block address limit in 64 word increments. rangeAddrLow when range mode is enabled, it specifies the lower logical block address limit. errorAddr If the test fails, it contains the error address (bit0 - bit12) and memory block index (Bit13 - Bit15)
- Returns
- Test Status (0-PASS, 1- FAIL)
| IFX_EXTERN void IfxMtu_writeSramAddress | ( | IfxMtu_MbistSel | mbistSel, |
| uint16 | sramAddress | ||
| ) |
